Avtech employs Highly Accelerated Life Testing (HALT) very early in the development cycle of an electromechanical or electronic system.  During the test, the temperature and vibration limits of the system are exceeded while also increasing electrical power stresses.  Ever increasing amounts of vibration, temperature and power levels are applied until an equipment malfunction occurs.  Once a failure occurs, it is analyzed, an improvement is made and the testing resumes.  This reiterative process is designed to find the weak link of the design, so that it may be improved or eliminated.  After the HALT process is finished, the design is more robust and theoretically more reliable. 

Once the unit has undergone HALT testing a Highly Accelerated Stress Screening (HASS) profile can be determined.  The HASS profile is a combination test that varies temperature, vibration, and operating specifications.  The units are operational and periodically power cycled.  The HASS testing limits are a sub-set of those determined during the HALT testing.  Done properly, a good unit can be subjected to HASS repeatedly without damage at a much faster duration that that of the more conventional burn in or  Electronic Stress Screening (ESS). HASS tends to be used at Avtech for high volume production runs where oven capabilities create bottlenecks in the product flow.